| 000 |
|
00965camuuu200301 a 4500 |
| 001 |
|
000000587298 |
| 003 |
|
OCoLC |
| 005 |
|
19980429144149.0 |
| 008 |
|
820609s1983 nyuaf b 001 0 eng |
| 010 |
|
▼a 82011070 //r89
|
| 019 |
|
▼a 9381146
|
| 020 |
|
▼a 0471861944 :
▼c $35.00 (est.)
|
| 040 |
|
▼a DLC
▼c DLC
|
| 049 |
|
▼l 121007305
▼l 121007306
▼l 121007307
|
| 050 |
0
|
▼a TK7882.P3
▼b A36 1983
|
| 082 |
0
|
▼a 001.4/34
▼2 19
|
| 090 |
|
▼a 001.434
▼b A287p
|
| 100 |
1
|
▼a Ahuja, Narendra,
▼d 1950-
|
| 245 |
1
0
|
▼a Pattern models /
▼c Narendra Ahuja, Bruce J. Schachter.
|
| 260 |
|
▼a New York :
▼b Wiley,
▼c c1983.
|
| 300 |
|
▼a xiv, 309 p., [2] p. of plates :
▼b ill. (some col.) ;
▼c 24 cm.
|
| 500 |
|
▼a "A Wiley-Interscience publication."
|
| 504 |
|
▼a Includes bibliographical references and indexes.
|
| 650 |
0
|
▼a Pattern recognition systems.
|
| 650 |
0
|
▼a Image processing.
|
| 650 |
0
|
▼a Geometrical models.
|
| 700 |
1
|
▼a Schachter, Bruce J.
▼q (Bruce Jay),
▼d 1946-.
|
