| 000 | 00842camuu2200241 a 4500 | |
| 001 | 000001078675 | |
| 005 | 20020913102505 | |
| 008 | 891113s1990 enka b 001 0 eng | |
| 020 | ▼a 0198513704 | |
| 040 | ▼a DLC ▼c DLC ▼d DLC ▼d 244002 | |
| 049 | 0 | ▼l 151084681 ▼l 151084795 |
| 050 | 0 0 | ▼a QD506 ▼b .R58 1990 |
| 082 | 0 0 | ▼a 530.417 ▼2 21 |
| 090 | ▼a 530.417 ▼b R625s | |
| 100 | 1 | ▼a Riviere, J. C. |
| 245 | 1 0 | ▼a Surface analytical techniques / ▼c J.C. Riviere. |
| 260 | ▼a Oxford [England] : ▼b Clarendon Press ; ▼a New York : ▼b Oxford University Press, ▼c 1990. | |
| 300 | ▼a xiii, 702 p. : ▼b ill. ; ▼c 24 cm. | |
| 440 | 0 | ▼a Monographs on the physics and chemistry of materials |
| 504 | ▼a Includes bibliographical references and index. | |
| 650 | 0 | ▼a Surfaces (Technology) ▼x Analysis. |
| 650 | 0 | ▼a Surface chemistry. |
Holdings Information
| No. | Location | Call Number | Accession No. | Availability | Due Date | Make a Reservation | Service |
|---|---|---|---|---|---|---|---|
| No. 1 | Location Sejong Academic Information Center/Science & Technology/ | Call Number 530.417 R625s | Accession No. 151084681 (3회 대출) | Availability Loan can not(reference room) | Due Date | Make a Reservation | Service |
| No. 2 | Location Sejong Academic Information Center/Science & Technology/ | Call Number 530.417 R625s | Accession No. 151084795 (1회 대출) | Availability Loan can not(reference room) | Due Date | Make a Reservation | Service |
Contents information
Book Introduction
Numerous techniques are available for providing detailed compositional information of the surface of materials. This volume aims to clarify those techniques which use particles as various kinds of probes for surface analysis. The techniques are grouped according to the nature of the incident radiation: electron excitation, photon excitation, ion excitation, and neutral excitation.
There are numerous techniques available for providing detailed compositional information of the surface of materials. This volume aims to clarify those techniques which use particles as various kinds of probes for surface analysis. For each technique it provides a description of the physical principle, the method of operation, the nature of information, the range of application, and the advantages and disadvantages of each of the current techniques of surface
compositional analysis. The techniques are grouped according to the nature of the incident radiation: electron excitation, photon excitation, ion excitation, and neutral excitation.
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Table of Contents
Introduction; Resume of physical principles; Instrumentation; Electron excitation: AES and SAM; Electron excitation: ELS, CEELS, and HREELS; Electron excitation: SXAPS, AEAPS, and DAPS; Electron excitation: IPES; Electron excitation: CLS and EIL; Electron excitation: ESD and ESDIAD; Photon excitation: XPS and XAES; Photon excitation: UPS and SRPS; Photon excitation: RAIRS and SERS; Ion excitation: AES and PAES; Ion excitation: INS and MQS; Ion excitation: IBSCA and GDOS; Ion excitation: ISS; Ion excitation: SSIMS; Ion excitation: SNMS and GDMS; Neutral excitation: FABMS; High field excitation: IETS; High field excitation: APFIM; High field excitation: STM and STS; Thermal excitation: TDS.
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